Overview of radiation effects on detector systems
In this section we give an overview of the effects of radiation on silicon detector systems in the LHC experiments. We divide the sections into: sensors; electronics; optoelectronics; services. While the physics of the energy loss between these categories is similar, the radiation quantities of interest used to evaluate damage are usually different. As an example, sensor radiation studies typically focus on the effects of bulk displacement damage, whereas degradation in electronics is generally more concerned with ionizing dose effects.
Copyright (c) 2021 CERN
This work is licensed under a Creative Commons Attribution 4.0 International License.
Authors who publish with this publication agree to the following terms:
- CERN retains copyright and publishes the work licensed under the Creative Commons Attribution License 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this series.
- Authors are able to enter into separate, additional contractual arrangements for distribution of the published version of the work (e.g., post it to an institutional repository or publish it in a book), with an acknowledgement of its initial publication in this series.
- Authors are permitted and encouraged to post their work online (e.g., in institutional repositories or on their website) prior to and during the submission process, as it can lead to productive exchanges, as well as earlier and greater citation of published work (See The Effect of Open Access).