Measurements of radiation damage on silicon sensors

Authors

  • A. De Cosa
  • B. Nachman
  • P. Collins
  • J.L. Agram
  • W. Barter
  • M. Baselga
  • M. Battaglia
  • J. Beyer
  • H.M. Borecka-Bielska
  • D. Brzhechko
  • I. Dawson
  • F. Djama
  • F. Feindt
  • A. Grummer
  • M. Hoeferkamp
  • J. Hunt
  • T. Kondo
  • V. Lima
  • A. Macchiolo
  • J. Llorente Merino
  • K. Mochizuki
  • G. Sarpis
  • S. Seidel
  • J. Sonneveld
  • S. Tsuno
  • M. Vignali
  • R. Wang

DOI:

https://doi.org/10.23731/CYRM-2021-001.59

Abstract

This chapter is organized as follows. Section 5.1 introduces, for each experiment, aspects of the detector set-up and measurement methods particularly relevant for the measurements. Next, the models used to interpret the data are summarized in Section 5.2. Then, in Section 5.3, we present the measurements for the above observables. The chapter ends with discussion and outlook in Section 5.4.

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Published

2021-04-13