Application of a Low-Energy Electron Beam as a Tool for ultrashort bunch length measurement in circular machines

Danila Nikiforov, Alexander Starostenko, Pavel Logatchov, Konstantin Rusinov, Dmitriy Malyutin, Alexandr Matveenko

Abstract


A new diagnostic device designed for non-destructive ultrashort bunch length measurement is described. The operating principle of the device and the measuring technique are described. The possible scheme of arrangement of the device elements are described. The results of simulations of EBP application for different beams under investigation are presented. The quality requirements of the low energy testing beam are considered and resolving detector ability is determined. 


Keywords


Bunch length; electron beam probe; low energy electron beam.

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DOI: http://dx.doi.org/10.23727/CERN-Proceedings-2017-001.153

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