Observations and Diagnostics in High Brightness Beams

Authors

DOI:

https://doi.org/10.23730/CYRSP-2017-003.229

Keywords:

Electron beam diagnostics, emittance.

Abstract

Brightness is a figure of merit largely used in light sources, such as free-electron lasers, but it is also fundamental in several other applications, for instance, Compton back-scattering sources, beam-driven plasma accelerators and terahertz sources. Advanced diagnostics is mandatory for the development of high brightness beams. 6D electron-beam diagnostics will be reviewed, with emphasis on emittance measurement.

Author Biography

Alessandro Cianchi, University of Rome Tor Vergata and INFN

Physics Department

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Published

2017-07-25